Compliance measurements of confined polystyrene solutions by atomic force microscopy.
نویسندگان
چکیده
R. M. Overney,1 D. P. Leta,1 C. F. Pictroski,1 M. H. Rafailovich,2 Y. Liu,2 J. Quinn,2 J. Sokolov,2 A. Eisenberg,3 and G. Overney4 1Exxon Research and Engineering Company, 1545 Route 22 East, Annandale, New Jersey 08801 2Department of Materials Science, State University of New York at Stony Brook, Stoney Brook, New York 11794-2275 3Department of Chemistry, McGill University, Montreal, Canada H3A 2K6 4Department of Chemistry, University of New Mexico, Albuquerque, New Mexico 87131-1096 (Received 16 August 1995)
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ورودعنوان ژورنال:
- Physical review letters
دوره 76 8 شماره
صفحات -
تاریخ انتشار 1996